Sec S3c2443x Test B D Driver

| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |

device_create(class, NULL, dev_num, NULL, "sec_testbd"); return 0; Sec S3c2443x Test B D Driver

struct sec_testbd_dma_desc __u64 src_addr; /* Physical address of source buffer */ __u64 dst_addr; /* Physical address of destination buffer */ __u32 length; /* Transfer size in bytes (max 4 MiB) */ __u32 flags; /* SEC_TESTBD_DMA_ENCRYPT ; The driver writes the descriptor into the SMI registers, triggers the transfer, and waits for the completion interrupt. Errors such as address misalignment or length overflow generate -EINVAL . Through SEC_TESTBD_IOCTL_CRYPTO , the user can request a single‑shot operation: | Parameter | Meaning | |-----------|---------| | mode

/* 4. Register char device */ ret = alloc_chrdev_region(&dev_num, 0, 1, "sec_testbd"); if (ret) return ret; cdev_init(&testbd->cdev, &sec_testbd_fops); testbd->cdev.owner = THIS_MODULE; ret = cdev_add(&testbd->cdev, dev_num, 1); if (ret) goto err_unregister; if (ret) return ret

During stress runs, the driver logs timestamps to /sys/kernel/debug/sec_testbd/stress_log for offline analysis. | Test | Throughput (DMA) | Latency (Crypto) | Power (mW) | |------|------------------|------------------|------------| | 1 GiB secure copy | 1.84 GB/s | – | 120 | | AES‑256‑ECB (256 MiB) | – | 3.2 µs/KB | 95 | | SHA‑256 (1 GiB) | – | 1.1 µs/KB | 88 | | Stress mode 0 (10 k iter) | 0.9 GB/s (average) | – | 130 |